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Understanding power consumption and reliability of high-ban..:
Nabavilarimi, Seyed Saber
;
Salami, Behzad
;
Unsal, Osman Sabri
...
https://ieeexplore.ieee.org/document/9474024. , 2021
Link:
http://hdl.handle.net/2117/349942
RT Journal T1
Understanding power consumption and reliability of high-bandwidth memory with voltage underscaling
UL https://suche.suub.uni-bremen.de/peid=base-ftupcatalunyair:oai:upcommons.upc.edu:2117_349942&Exemplar=1&LAN=DE A1 Nabavilarimi, Seyed Saber A1 Salami, Behzad A1 Unsal, Osman Sabri A1 Cristal Kestelman, Adrián A1 Sarbazi-Azad, Hamid A1 Mutlu, Onur PB Institute of Electrical and Electronics Engineers (IEEE) YR 2021 K1 Àrees temàtiques de la UPC::Informàtica::Arquitectura de computadors K1 Memory management (Computer science) K1 Semiconductors -- Energy consumption K1 High-bandwidth memory K1 Power consumption K1 Voltage scaling K1 Fault characterization K1 Reliability K1 Gestió de memòria (Informàtica) K1 Semiconductors – Consum d'energia JF https://ieeexplore.ieee.org/document/9474024 LK http://hdl.handle.net/2117/349942 DO http://hdl.handle.net/2117/349942 SF ELIB - SuUB Bremen
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