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Modeling of the degradation of CMOS inverters under pulsed ..:
Crespo Yepes, Albert
;
Ramos Hortal, Regina
;
Barajas Ojeda, Enrique
...
https://www.sciencedirect.com/science/article/abs/pii/S0038110121001398. , 2021
Link:
http://hdl.handle.net/2117/366511
RT Journal T1
Modeling of the degradation of CMOS inverters under pulsed stress conditions from 'on-the-fly' measurements
UL https://suche.suub.uni-bremen.de/peid=base-ftupcatalunyair:oai:upcommons.upc.edu:2117_366511&Exemplar=1&LAN=DE A1 Crespo Yepes, Albert A1 Ramos Hortal, Regina A1 Barajas Ojeda, Enrique A1 Aragonès Cervera, Xavier A1 Mateo Peña, Diego A1 Martin Martínez, Javier A1 Rodríguez Martínez, Rosana A1 Nafría Maqueda, Montserrat YR 2021 K1 Àrees temàtiques de la UPC::Enginyeria electrònica::Electrònica de potència::Convertidors de corrent elèctric K1 Electric inverters K1 Metal oxide semiconductors K1 Complementary K1 CMOS technology K1 On-the-fly stress characterization K1 Circuit performance degradation K1 Transistor aging K1 CMOS inverters K1 Measurement technique K1 Analytical modelling K1 Convertidors continu-altern K1 Metall-òxid-semiconductors complementaris JF https://www.sciencedirect.com/science/article/abs/pii/S0038110121001398 LK http://hdl.handle.net/2117/366511 DO http://hdl.handle.net/2117/366511 SF ELIB - SuUB Bremen
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