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Depth profiles of aggregate centers and nanodefects in LiF ..:
Dauletbekova, A
;
Skuratov, V
;
Kirilkin, N
...
Depth profiles of aggregate centers and nanodefects in LiF crystals irradiated with 34 MeV 84Kr, 56 MeV 40Ar and 12 MeV 12C ions / A. Dauletbekova, V. Skuratov, N. Kirilkin, et al. — DOI 10.1016/j.surfcoat.2018.03.096 // Surface and Coatings Technology. — 2018. — Vol. 355. — P. 16-21.. , 2018
Link:
http://elar.urfu.ru/handle/10995/102008
RT Journal T1
Depth profiles of aggregate centers and nanodefects in LiF crystals irradiated with 34 MeV 84Kr, 56 MeV 40Ar and 12 MeV 12C ions
UL https://suche.suub.uni-bremen.de/peid=base-fturalfuniv:oai:elar.urfu.ru:10995_102008&Exemplar=1&LAN=DE A1 Dauletbekova, A A1 Skuratov, V A1 Kirilkin, N A1 Manika, I A1 Maniks, J A1 Zabels, R A1 Akilbekov, A A1 Volkov, A A1 Baizhumanov, M A1 Zdorovets, M A1 Seitbayev, A PB Elsevier B.V. YR 2018 K1 DAMAGE DEPTH PROFILES K1 DISLOCATIONS K1 F2 AND F3 + CENTERS K1 HARDENING K1 ION IRRADIATION K1 LIF CRYSTALS K1 PHOTOLUMINESCENCE K1 AGGREGATES K1 COLOR CENTERS K1 DISLOCATIONS (CRYSTALS) K1 ENERGY DISSIPATION K1 ETCHING K1 ION BOMBARDMENT K1 IONS K1 LITHIUM COMPOUNDS K1 NANOHARDNESS K1 ELECTRONIC ENERGY LOSS K1 F2 AND F3^+ CENTERS K1 IRRADIATION EXPERIMENTS K1 LASER SCANNING CONFOCAL MICROSCOPY K1 LIF CRYSTAL K1 LUMINESCENCE INTENSITY K1 LUMINESCENCE SIGNALS K1 NANOINDENTATION TECHNIQUES K1 FLUORINE COMPOUNDS JF Depth profiles of aggregate centers and nanodefects in LiF crystals irradiated with 34 MeV 84Kr, 56 MeV 40Ar and 12 MeV 12C ions / A. Dauletbekova, V. Skuratov, N. Kirilkin, et al. — DOI 10.1016/j.surfcoat.2018.03.096 // Surface and Coatings Technology. — 2018. — Vol. 355. — P. 16-21. LK http://elar.urfu.ru/handle/10995/102008 DO http://elar.urfu.ru/handle/10995/102008 SF ELIB - SuUB Bremen
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