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1 Ergebnisse
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A differential Hall effect measurement method with sub-nano..:
Daubriac, Richard
;
Scheid, Emmanuel
;
Rizk, Hiba
...
info:eu-repo/semantics/altIdentifier/doi/10.3762/bjnano.9.184. , 2018
Link:
https://hal.science/hal-01921179
RT Journal T1
A differential Hall effect measurement method with sub-nanometre resolution for active dopant concentration profiling in ultrathin doped Si 1− x Ge x and Si layers
UL https://suche.suub.uni-bremen.de/peid=base-ftutoulouse3hal:oai:HAL:hal-01921179v1&Exemplar=1&LAN=DE A1 Daubriac, Richard A1 Scheid, Emmanuel A1 Rizk, Hiba A1 Monflier, Richard A1 Joblot, Sylvain A1 Beneyton, Rémi A1 Acosta Alba, Pablo A1 Kerdilès, Sébastien A1 Cristiano, Fuccio PB HAL CCSD; Karlsruhe Institute of Technology. YR 2018 K1 differential Hall effect K1 contact resistance K1 carrier mobility K1 dopant activation K1 fully depleted silicon on insulator (FDSOI) K1 laser annealing K1 sub-nanometre resolution K1 [SPI]Engineering Sciences [physics] K1 [SPI.MAT]Engineering Sciences [physics]/Materials K1 [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics JF info:eu-repo/semantics/altIdentifier/doi/10.3762/bjnano.9.184 LK http://dx.doi.org/https://hal.science/hal-01921179 DO https://hal.science/hal-01921179 SF ELIB - SuUB Bremen
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