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1 Ergebnisse
1
An intelligent workstation for reliable residual stress det..:
Dehan, Christophe F
OCLC# 20432603. , 1989
Link:
http://hdl.handle.net/10919/43086
RT Journal T1
An intelligent workstation for reliable residual stress determination using x-ray diffraction
UL https://suche.suub.uni-bremen.de/peid=base-ftvirginiatec:oai:vtechworks.lib.vt.edu:10919_43086&Exemplar=1&LAN=DE A1 Dehan, Christophe F PB Virginia Tech YR 1989 K1 LD5655.V855 1989.D442 K1 Engineering instruments K1 X-rays -- Diffraction JF OCLC# 20432603 LK http://hdl.handle.net/10919/43086 DO http://hdl.handle.net/10919/43086 SF ELIB - SuUB Bremen
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