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1 Ergebnisse
1
Influence of Measurement System on Negative Bias Temperatur..:
Vincent King Soon Wong
;
Hong Seng Ng
;
Florinna Sim
doi:10.5281/zenodo.1339901. , 2017
Link:
https://zenodo.org/record/1339902
RT Journal T1
Influence of Measurement System on Negative Bias Temperature Instability Characterization: Fast BTI vs Conventional BTI vs Fast Wafer Level Reliability
UL https://suche.suub.uni-bremen.de/peid=base-ftzenodo:oai:zenodo.org:1339902&Exemplar=1&LAN=DE A1 Vincent King Soon Wong A1 Hong Seng Ng A1 Florinna Sim YR 2017 JF doi:10.5281/zenodo.1339901 LK http://dx.doi.org/https://zenodo.org/record/1339902 DO https://zenodo.org/record/1339902 SF ELIB - SuUB Bremen
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