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1 Ergebnisse
1
OPTIMUM THICKNESS DETERMINATION TECHNIQUE AS APPLIED TO A S..:
Omar Dia
;
Mohamed Abderrahim Ould El Moujtaba
;
Sega Gueye
...
doi:10.5281/zenodo.3938646. , 2020
Link:
https://zenodo.org/record/3938647
RT Journal T1
OPTIMUM THICKNESS DETERMINATION TECHNIQUE AS APPLIED TO A SERIES VERTICAL JUNCTION SILICON SOLAR CELL UNDER POLYCHROMATIC ILLUMINATION: EFFECT OF IRRADIATION
UL https://suche.suub.uni-bremen.de/peid=base-ftzenodo:oai:zenodo.org:3938647&Exemplar=1&LAN=DE A1 Omar Dia A1 Mohamed Abderrahim Ould El Moujtaba A1 Sega Gueye A1 Mamadou Lamine Ba A1 Ibrahima Diatta A1 Gora Diop A1 Marcel Sitor Diouf A1 Gregoire Sissoko YR 2020 K1 Silicon Solar Cell - Vertical Junction Series - Irradiation - Back Surface Recombination Velocity - Optimum Thickness JF doi:10.5281/zenodo.3938646 LK http://dx.doi.org/https://zenodo.org/record/3938647 DO https://zenodo.org/record/3938647 SF ELIB - SuUB Bremen
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