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A temperature characterization of (Si-FinFET) based on chan..:
Yousif Atalla
;
Yasir Hashim
;
Abdul Nasir Abd Ghafar
.
https://zenodo.org/record/3955490. , 2019
Link:
https://zenodo.org/record/3955490
RT Journal T1
A temperature characterization of (Si-FinFET) based on channel oxide thickness
UL https://suche.suub.uni-bremen.de/peid=base-ftzenodo:oai:zenodo.org:3955490&Exemplar=1&LAN=DE A1 Yousif Atalla A1 Yasir Hashim A1 Abdul Nasir Abd Ghafar A1 Waheb A. Jabbar YR 2019 K1 FinFET K1 nano-sensor K1 oxide thickness K1 temperature JF https://zenodo.org/record/3955490 LK http://dx.doi.org/https://zenodo.org/record/3955490 DO https://zenodo.org/record/3955490 SF ELIB - SuUB Bremen
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