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1 Ergebnisse
1
Gwyscope: A Scanning Probe Microscopy controller with advan..:
Valtr, Miroslav
;
Klapetek, Petr
;
Martinek, Jan
...
doi:10.1016/j.ohx.2023.e00451. , 2023
Link:
https://zenodo.org/record/7688987
RT Journal T1
Gwyscope: A Scanning Probe Microscopy controller with advanced sampling support
UL https://suche.suub.uni-bremen.de/peid=base-ftzenodo:oai:zenodo.org:7688987&Exemplar=1&LAN=DE A1 Valtr, Miroslav A1 Klapetek, Petr A1 Martinek, Jan A1 Novotný, Ondřej A1 Jelínek, Zdeněk A1 Hortvík, Václav A1 Nečas, David YR 2023 K1 Scanning Probe Microscopy K1 adaptive sampling K1 Field Programmable Gate Array JF doi:10.1016/j.ohx.2023.e00451 LK http://dx.doi.org/https://zenodo.org/record/7688987 DO https://zenodo.org/record/7688987 SF ELIB - SuUB Bremen
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