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1 Ergebnisse
1
Robustness assessment via simulation-based fault injection ..:
Tuzov, Ilya
;
de Andrés, David
;
Ruiz, Juan-Carlos
doi:10.5281/zenodo.890995. , 2017
Link:
https://zenodo.org/record/891316
RT Journal T1
Robustness assessment via simulation-based fault injection of the implementation level models of the LEON3, MC8051, and PIC microcontrollers in presence of stuck-at, bit-flip, pulse, and delay fault models
UL https://suche.suub.uni-bremen.de/peid=base-ftzenodo:oai:zenodo.org:891316&Exemplar=1&LAN=DE A1 Tuzov, Ilya A1 de Andrés, David A1 Ruiz, Juan-Carlos YR 2017 K1 Simulation-based fault injection K1 VHDL K1 LEON3 K1 MC8051 K1 PIC JF doi:10.5281/zenodo.890995 LK http://dx.doi.org/https://zenodo.org/record/891316 DO https://zenodo.org/record/891316 SF ELIB - SuUB Bremen
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