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Microstructuring of As40S60 wafers exposed to soft X-rays:

Danev, G. ; Spassova, E. ; Assa, J..
Advanced Materials for Optics and Electronics.  8 (1998)  3 - p. 129-133 , 1998
Link: https://doi.org/10.1002/(sici)1099-0712(199805/06)8:3<..