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1 Ergebnisse
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Impact of Stacking Faults and Domain Boundaries on the Elec..:
Giannazzo, Filippo
;
Greco, Giuseppe
;
Di Franco, Salvatore
...
Advanced Electronic Materials. 6 (2020) 2 - p. , 2020
Link:
https://doi.org/10.1002/aelm.201901171
RT Journal T1
Impact of Stacking Faults and Domain Boundaries on the Electronic Transport in Cubic Silicon Carbide Probed by Conductive Atomic Force Microscopy
UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_aelm.201901171&Exemplar=1&LAN=DE A1 Giannazzo, Filippo A1 Greco, Giuseppe A1 Di Franco, Salvatore A1 Fiorenza, Patrick A1 Deretzis, Ioannis A1 La Magna, Antonino A1 Bongiorno, Corrado A1 Zimbone, Massimo A1 La Via, Francesco A1 Zielinski, Marcin A1 Roccaforte, Fabrizio PB Wiley YR 2020 SN 2199-160X SN 2199-160X JF Advanced Electronic Materials VO 6 IS 2 LK http://dx.doi.org/https://doi.org/10.1002/aelm.201901171 DO https://doi.org/10.1002/aelm.201901171 SF ELIB - SuUB Bremen
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