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1 Ergebnisse
1
Multi‐Level Control of Conductive Filament Evolution and En..:
Kim, Hae Jin
;
Kim, Jihun
;
Park, Tae Gyun
..
Advanced Electronic Materials. 8 (2021) 8 - p. , 2021
Link:
https://doi.org/10.1002/aelm.202100209
RT Journal T1
Multi‐Level Control of Conductive Filament Evolution and Enhanced Resistance Controllability of the Cu‐Cone Structure Embedded Conductive Bridge Random Access Memory
UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_aelm.202100209&Exemplar=1&LAN=DE A1 Kim, Hae Jin A1 Kim, Jihun A1 Park, Tae Gyun A1 Yoon, Jung Ho A1 Hwang, Cheol Seong PB Wiley YR 2021 SN 2199-160X SN 2199-160X JF Advanced Electronic Materials VO 8 IS 8 LK http://dx.doi.org/https://doi.org/10.1002/aelm.202100209 DO https://doi.org/10.1002/aelm.202100209 SF ELIB - SuUB Bremen
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