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1 Ergebnisse
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The Trends of In Situ Focused Ion Beam Technology: Toward P..:
Zhang, Zijian
;
Wang, Wanting
;
Dong, Zuoyuan
...
Advanced Electronic Materials. 8 (2022) 9 - p. , 2022
Link:
https://doi.org/10.1002/aelm.202101401
RT Journal T1
The Trends of In Situ Focused Ion Beam Technology: Toward Preparing Transmission Electron Microscopy Lamella and Devices at the Atomic Scale
UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_aelm.202101401&Exemplar=1&LAN=DE A1 Zhang, Zijian A1 Wang, Wanting A1 Dong, Zuoyuan A1 Yang, Xin A1 Liang, Fang A1 Chen, Xinqian A1 Wang, Chaolun A1 Luo, Chen A1 Zhang, Jiayan A1 Wu, Xing A1 Sun, Litao A1 Chu, Junhao PB Wiley YR 2022 SN 2199-160X SN 2199-160X JF Advanced Electronic Materials VO 8 IS 9 LK http://dx.doi.org/https://doi.org/10.1002/aelm.202101401 DO https://doi.org/10.1002/aelm.202101401 SF ELIB - SuUB Bremen
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