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1 Ergebnisse
1
Defect Engineering for High Performance and Extremely Relia..:
Park, Young‐Gil
;
Cho, Dong Yeon
;
Kim, Ran
...
Advanced Electronic Materials. 8 (2022) 7 - p. , 2022
Link:
https://doi.org/10.1002/aelm.202270036
RT Journal T1
Defect Engineering for High Performance and Extremely Reliable a‐IGZO Thin‐Film Transistor in QD‐OLED (Adv. Electron. Mater. 7/2022)
UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_aelm.202270036&Exemplar=1&LAN=DE A1 Park, Young‐Gil A1 Cho, Dong Yeon A1 Kim, Ran A1 Kim, Kang Hyun A1 Lee, Ju Won A1 Lee, Doo Hyoung A1 Jeong, Soo Im A1 Ahn, Na Ri A1 Lee, Woo‐Geun A1 Choi, Jae Beom A1 Kim, Min Jung A1 Kim, Donghyun A1 Jin, Seunghee A1 Park, Dong Geun A1 Kim, Jungchun A1 Choi, Saeyan A1 Bang, Seain A1 Lee, Jae Woo PB Wiley YR 2022 SN 2199-160X SN 2199-160X JF Advanced Electronic Materials VO 8 IS 7 LK http://dx.doi.org/https://doi.org/10.1002/aelm.202270036 DO https://doi.org/10.1002/aelm.202270036 SF ELIB - SuUB Bremen
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