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Interplay between Strain and Defects at the Interfaces of U..:
Segantini, Greta
;
Manchon, Benoît
;
Cañero Infante, Ingrid
...
Advanced Electronic Materials. 9 (2023) 10 - p. , 2023
Link:
https://doi.org/10.1002/aelm.202300171
RT Journal T1
Interplay between Strain and Defects at the Interfaces of Ultra‐Thin Hf0.5Zr0.5O2‐Based Ferroelectric Capacitors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_aelm.202300171&Exemplar=1&LAN=DE A1 Segantini, Greta A1 Manchon, Benoît A1 Cañero Infante, Ingrid A1 Bugnet, Matthieu A1 Barhoumi, Rabei A1 Nirantar, Shruti A1 Mayes, Edwin A1 Rojo Romeo, Pedro A1 Blanchard, Nicholas A1 Deleruyelle, Damien A1 Sriram, Sharath A1 Vilquin, Bertrand PB Wiley YR 2023 SN 2199-160X SN 2199-160X JF Advanced Electronic Materials VO 9 IS 10 LK http://dx.doi.org/https://doi.org/10.1002/aelm.202300171 DO https://doi.org/10.1002/aelm.202300171 SF ELIB - SuUB Bremen
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