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1 Ergebnisse
1
Field Induced Off‐State Instability in InGaZnO Thin‐Film Tr..:
Kang, Minseung
;
Cho, Ung
;
Kang, Jaehyeon
...
Advanced Electronic Materials. 10 (2024) 8 - p. , 2024
Link:
https://doi.org/10.1002/aelm.202300900
RT Journal T1
Field Induced Off‐State Instability in InGaZnO Thin‐Film Transistor and its Impact on Synaptic Circuits
UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_aelm.202300900&Exemplar=1&LAN=DE A1 Kang, Minseung A1 Cho, Ung A1 Kang, Jaehyeon A1 Han, Narae A1 Seo, Hyeong Jun A1 Yang, Jee‐Eun A1 Shin, Seokyeon A1 Kim, Taehyun A1 Kim, Sangwook A1 Jeong, Changwook A1 Kim, Sangbum PB Wiley YR 2024 SN 2199-160X SN 2199-160X JF Advanced Electronic Materials VO 10 IS 8 LK http://dx.doi.org/https://doi.org/10.1002/aelm.202300900 DO https://doi.org/10.1002/aelm.202300900 SF ELIB - SuUB Bremen
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