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1 Ergebnisse
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Combined Secondary Ion Mass Spectrometry Depth Profiling an..:
Hai, Nguyen T. M.
;
Lechner, David
;
Stricker, Florian
..
ChemElectroChem. 2 (2015) 5 - p. 664-671 , 2015
Link:
https://doi.org/10.1002/celc.201402427
RT Journal T1
Combined Secondary Ion Mass Spectrometry Depth Profiling and Focused Ion Beam Analysis of Cu Films Electrodeposited under Oscillatory Conditions
UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_celc.201402427&Exemplar=1&LAN=DE A1 Hai, Nguyen T. M. A1 Lechner, David A1 Stricker, Florian A1 Furrer, Julien A1 Broekmann, Peter PB Wiley YR 2015 SN 2196-0216 SN 2196-0216 JF ChemElectroChem VO 2 IS 5 SP 664 OP 671 LK http://dx.doi.org/https://doi.org/10.1002/celc.201402427 DO https://doi.org/10.1002/celc.201402427 SF ELIB - SuUB Bremen
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