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X‐ray micrographic imaging system based on COTS CMOS sensor:
Alcalde Bessia, Fabricio
;
Pérez, Martin
;
Lipovetzky, José
...
International Journal of Circuit Theory and Applications. 46 (2018) 10 - p. 1848-1857 , 2018
Link:
https://doi.org/10.1002/cta.2502
RT Journal T1 <Title>X‐ray micrographic imaging system based on COTS CMOS sensors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_cta.2502&Exemplar=1&LAN=DE A1 Alcalde Bessia, Fabricio A1 Pérez, Martin A1 Lipovetzky, José A1 Piunno, Natalia Alejandra A1 Mateos, Horacio A1 Sidelnik, Iván A1 Blostein, Juan Jerónimo A1 Sofo Haro, Miguel A1 Gómez Berisso, Mariano PB Wiley YR 2018 SN 0098-9886 SN 1097-007X JF International Journal of Circuit Theory and Applications VO 46 IS 10 SP 1848 OP 1857 LK http://dx.doi.org/https://doi.org/10.1002/cta.2502 DO https://doi.org/10.1002/cta.2502 SF ELIB - SuUB Bremen
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