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1 Ergebnisse
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Twin‐Probe Atomic Force Microscopy with Optical Beam Deflec..:
SATOH, NOBUO
;
TSUNEMI, EIKA
;
KOBAYASHI, KEI
...
Electronics and Communications in Japan. 99 (2016) 9 - p. 92-100 , 2016
Link:
https://doi.org/10.1002/ecj.11862
RT Journal T1 <Title>Twin‐Probe Atomic Force Microscopy with Optical Beam Deflection Using Vertically Incident Lasers by Two Beam Splitter</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_ecj.11862&Exemplar=1&LAN=DE A1 SATOH, NOBUO A1 TSUNEMI, EIKA A1 KOBAYASHI, KEI A1 KOMATSUBARA, TAKASHI A1 HIGUCHI, SEIJI A1 MATSUSHIGE, KAZUMI A1 YAMADA, HIROFUMI PB Wiley YR 2016 SN 1942-9533 SN 1942-9541 JF Electronics and Communications in Japan VO 99 IS 9 SP 92 OP 100 LK http://dx.doi.org/https://doi.org/10.1002/ecj.11862 DO https://doi.org/10.1002/ecj.11862 SF ELIB - SuUB Bremen
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