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1 Ergebnisse
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Ambient atomic resolution atomic force microscopy with qPlu..:
Wastl, Daniel S.
Microscopy Research and Technique. 80 (2016) 1 - p. 50-65 , 2016
Link:
https://doi.org/10.1002/jemt.22730
RT Journal T1 <Title>Ambient atomic resolution atomic force microscopy with qPlus sensors: Part 1</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_jemt.22730&Exemplar=1&LAN=DE A1 Wastl, Daniel S. PB Wiley YR 2016 SN 1059-910X SN 1097-0029 JF Microscopy Research and Technique VO 80 IS 1 SP 50 OP 65 LK http://dx.doi.org/https://doi.org/10.1002/jemt.22730 DO https://doi.org/10.1002/jemt.22730 SF ELIB - SuUB Bremen
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