I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Micromorphology analysis of TiO2 thin films by atomic force..:
Ţălu, Ştefan
;
Achour, Amine
;
Solaymani, Shahram
...
Microscopy Research and Technique. 83 (2020) 5 - p. 457-463 , 2020
Link:
https://doi.org/10.1002/jemt.23433
RT Journal T1
Micromorphology analysis of TiO2 thin films by atomic force microscopy images: The influence of postannealing
UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_jemt.23433&Exemplar=1&LAN=DE A1 Ţălu, Ştefan A1 Achour, Amine A1 Solaymani, Shahram A1 Nikpasand, Kimia A1 Dalouji, Vali A1 Sari, Amirhossein A1 Rezaee, Sahar A1 Nezafat, Negin B. PB Wiley YR 2020 SN 1059-910X SN 1097-0029 JF Microscopy Research and Technique VO 83 IS 5 SP 457 OP 463 LK http://dx.doi.org/https://doi.org/10.1002/jemt.23433 DO https://doi.org/10.1002/jemt.23433 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)