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1 Ergebnisse
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Stereometric analysis of Ti1−xAlxN thin films deposited by ..:
Matos, Robert Saraiva
;
da Fonseca Filho, Henrique Duarte
;
Das, Abhijeet
...
Microscopy Research and Technique. 85 (2021) 1 - p. 296-307 , 2021
Link:
https://doi.org/10.1002/jemt.23905
RT Journal T1
Stereometric analysis of Ti1−xAlxN thin films deposited by direct current/radio frequency magnetron sputtering
UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_jemt.23905&Exemplar=1&LAN=DE A1 Matos, Robert Saraiva A1 da Fonseca Filho, Henrique Duarte A1 Das, Abhijeet A1 Kumar, Sanjeev A1 Chawla, Vipin A1 Ţălu, Ştefan PB Wiley YR 2021 SN 1059-910X SN 1097-0029 JF Microscopy Research and Technique VO 85 IS 1 SP 296 OP 307 LK http://dx.doi.org/https://doi.org/10.1002/jemt.23905 DO https://doi.org/10.1002/jemt.23905 SF ELIB - SuUB Bremen
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