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1 Ergebnisse
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DC‐bias and temperature included CSWPL model for RF power t..:
Liu, Enduo
;
Tang, Xiaoqiang
;
Crupi, Giovanni
.
International Journal of Numerical Modelling: Electronic Networks, Devices and Fields. 37 (2024) 2 - p. , 2024
Link:
https://doi.org/10.1002/jnm.3229
RT Journal T1 <Title>DC‐bias and temperature included CSWPL model for RF power transistors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_jnm.3229&Exemplar=1&LAN=DE A1 Liu, Enduo A1 Tang, Xiaoqiang A1 Crupi, Giovanni A1 Cai, Jialin PB Wiley YR 2024 SN 0894-3370 SN 1099-1204 JF International Journal of Numerical Modelling: Electronic Networks, Devices and Fields VO 37 IS 2 LK http://dx.doi.org/https://doi.org/10.1002/jnm.3229 DO https://doi.org/10.1002/jnm.3229 SF ELIB - SuUB Bremen
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