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Experimental decomposition of the positive bias temperature..:
Kim, Dae Hwan
;
Choi, Sungju
;
Jang, Juntae
...
Journal of the Society for Information Display. 25 (2017) 2 - p. 98-107 , 2017
Link:
https://doi.org/10.1002/jsid.531
RT Journal T1 <Title>Experimental decomposition of the positive bias temperature stress-induced instability in self-aligned coplanar InGaZnO thin-film transistors and its modeling based on the multiple stretched-exponential functions: Decomposition of the PBTS instability in IGZO TFTs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_jsid.531&Exemplar=1&LAN=DE A1 Kim, Dae Hwan A1 Choi, Sungju A1 Jang, Juntae A1 Kang, Hara A1 Kim, Dong Myong A1 Choi, Sung-Jin A1 Kim, Yong-Sung A1 Oh, Saeroonter A1 Baeck, Ju Heyuck A1 Bae, Jong Uk A1 Park, Kwon-Shik A1 Yoon, Soo Young A1 Kang, In Byeong PB Wiley YR 2017 SN 1071-0922 JF Journal of the Society for Information Display VO 25 IS 2 SP 98 OP 107 LK http://dx.doi.org/https://doi.org/10.1002/jsid.531 DO https://doi.org/10.1002/jsid.531 SF ELIB - SuUB Bremen
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