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1 Ergebnisse
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A new algorithm on the automatic TFT‐LCD mura defects inspe..:
Ngo, Chinh
;
Park, Yong Jin
;
Jung, Jeehyun
..
Journal of the Society for Information Display. 25 (2017) 12 - p. 737-752 , 2017
Link:
https://doi.org/10.1002/jsid.622
RT Journal T1 <Title>A new algorithm on the automatic TFT‐LCD mura defects inspection based on an effective background reconstruction</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_jsid.622&Exemplar=1&LAN=DE A1 Ngo, Chinh A1 Park, Yong Jin A1 Jung, Jeehyun A1 Hassan, Rizwan Ul A1 Seok, Jongwon PB Wiley YR 2017 SN 1071-0922 SN 1938-3657 JF Journal of the Society for Information Display VO 25 IS 12 SP 737 OP 752 LK http://dx.doi.org/https://doi.org/10.1002/jsid.622 DO https://doi.org/10.1002/jsid.622 SF ELIB - SuUB Bremen
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