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A fast and practical approach to the determination of junct..:
Ooi, Ban Leong
;
Chen, Bo
;
Lin, Fujiang
..
Microwave and Optical Technology Letters. 35 (2002) 6 - p. 499-502 , 2002
Link:
https://doi.org/10.1002/mop.10648
RT Journal T1 <Title>A fast and practical approach to the determination of junction temperature and thermal resistance for BJT/HBT devices</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_mop.10648&Exemplar=1&LAN=DE A1 Ooi, Ban Leong A1 Chen, Bo A1 Lin, Fujiang A1 Kooi, Pang Shyan A1 Hui, Chi So PB Wiley YR 2002 SN 0895-2477 SN 1098-2760 JF Microwave and Optical Technology Letters VO 35 IS 6 SP 499 OP 502 LK http://dx.doi.org/https://doi.org/10.1002/mop.10648 DO https://doi.org/10.1002/mop.10648 SF ELIB - SuUB Bremen
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