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1 Ergebnisse
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Reliability of loss‐coupled 1.55 μm DFB laser diode with au..:
Han, Jae‐Ho
;
Park, Sung‐Woong
Microwave and Optical Technology Letters. 49 (2007) 3 - p. 636-638 , 2007
Link:
https://doi.org/10.1002/mop.22208
RT Journal T1 <Title>Reliability of loss‐coupled 1.55 μm DFB laser diode with automatically buried absorptive InAsP layer</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_mop.22208&Exemplar=1&LAN=DE A1 Han, Jae‐Ho A1 Park, Sung‐Woong PB Wiley YR 2007 SN 0895-2477 SN 1098-2760 JF Microwave and Optical Technology Letters VO 49 IS 3 SP 636 OP 638 LK http://dx.doi.org/https://doi.org/10.1002/mop.22208 DO https://doi.org/10.1002/mop.22208 SF ELIB - SuUB Bremen
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