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Dual‐band and enhanced band FSS characterization using WCIP..:
Titaouine, M.
;
Raveu, N.
;
Gomes Neto, A.
.
Microwave and Optical Technology Letters. 52 (2010) 4 - p. 836-839 , 2010
Link:
https://doi.org/10.1002/mop.25073
RT Journal T1 <Title>Dual‐band and enhanced band FSS characterization using WCIP method</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_mop.25073&Exemplar=1&LAN=DE A1 Titaouine, M. A1 Raveu, N. A1 Gomes Neto, A. A1 Baudrand, H. PB Wiley YR 2010 SN 0895-2477 SN 1098-2760 JF Microwave and Optical Technology Letters VO 52 IS 4 SP 836 OP 839 LK http://dx.doi.org/https://doi.org/10.1002/mop.25073 DO https://doi.org/10.1002/mop.25073 SF ELIB - SuUB Bremen
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