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Continuous‐wave scanning terahertz near‐field microscope:
Guillet, J.‐P.
;
Chusseau, L.
;
Adam, R.
...
Microwave and Optical Technology Letters. 53 (2011) 3 - p. 580-582 , 2011
Link:
https://doi.org/10.1002/mop.25754
RT Journal T1 <Title>Continuous‐wave scanning terahertz near‐field microscope</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_mop.25754&Exemplar=1&LAN=DE A1 Guillet, J.‐P. A1 Chusseau, L. A1 Adam, R. A1 Grosjean, T. A1 Penarier, A. A1 Baida, F. A1 Charraut, D. PB Wiley YR 2011 SN 0895-2477 SN 1098-2760 JF Microwave and Optical Technology Letters VO 53 IS 3 SP 580 OP 582 LK http://dx.doi.org/https://doi.org/10.1002/mop.25754 DO https://doi.org/10.1002/mop.25754 SF ELIB - SuUB Bremen
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