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GaN HEMT noise modeling based on 50‐Ω noise factor:
Crupi, Giovanni
;
Caddemi, Alina
;
Raffo, Antonio
...
Microwave and Optical Technology Letters. 57 (2015) 4 - p. 937-942 , 2015
Link:
https://doi.org/10.1002/mop.28983
RT Journal T1 <Title>GaN HEMT noise modeling based on 50‐Ω noise factor</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_mop.28983&Exemplar=1&LAN=DE A1 Crupi, Giovanni A1 Caddemi, Alina A1 Raffo, Antonio A1 Salvo, Giuseppe A1 Nalli, Andrea A1 Vannini, Giorgio PB Wiley YR 2015 SN 0895-2477 SN 1098-2760 JF Microwave and Optical Technology Letters VO 57 IS 4 SP 937 OP 942 LK http://dx.doi.org/https://doi.org/10.1002/mop.28983 DO https://doi.org/10.1002/mop.28983 SF ELIB - SuUB Bremen
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