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Measurement of refraction index of thick and nontransparent..:
Moungache, A.
;
Bayard, B.
;
Tahir, Abakar Mahamat
...
Microwave and Optical Technology Letters. 57 (2015) 4 - p. 1006-1013 , 2015
Link:
https://doi.org/10.1002/mop.28998
RT Journal T1 <Title>Measurement of refraction index of thick and nontransparent isotropic material using transmission microwave ellipsometry</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_mop.28998&Exemplar=1&LAN=DE A1 Moungache, A. A1 Bayard, B. A1 Tahir, Abakar Mahamat A1 Robert, S. A1 Jamon, D. A1 Gambou, F. PB Wiley YR 2015 SN 0895-2477 SN 1098-2760 JF Microwave and Optical Technology Letters VO 57 IS 4 SP 1006 OP 1013 LK http://dx.doi.org/https://doi.org/10.1002/mop.28998 DO https://doi.org/10.1002/mop.28998 SF ELIB - SuUB Bremen
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