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Optical characterization of high and low resistive silicon ..:
Ali, Abdul
;
Topalli, Kagan
;
Ramzan, Mehrab
...
Microwave and Optical Technology Letters. 61 (2018) 1 - p. 107-110 , 2018
Link:
https://doi.org/10.1002/mop.31506
RT Journal T1 <Title>Optical characterization of high and low resistive silicon samples suitable for reconfigurable antenna design</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_mop.31506&Exemplar=1&LAN=DE A1 Ali, Abdul A1 Topalli, Kagan A1 Ramzan, Mehrab A1 Khan, Talha Masood A1 Altintas, Ayhan A1 Colantonio, Paolo PB Wiley YR 2018 SN 0895-2477 SN 1098-2760 JF Microwave and Optical Technology Letters VO 61 IS 1 SP 107 OP 110 LK http://dx.doi.org/https://doi.org/10.1002/mop.31506 DO https://doi.org/10.1002/mop.31506 SF ELIB - SuUB Bremen
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