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1 Ergebnisse
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Durability test of PVP-capped Pt nanoclusters counter elect..:
Lan, Jo-Lin
;
Wan, Chi-Chao
;
Wei, Tzu-Chien
..
Progress in Photovoltaics: Research and Applications. 20 (2011) 1 - p. 44-50 , 2011
Link:
https://doi.org/10.1002/pip.1107
RT Journal T1 <Title>Durability test of PVP-capped Pt nanoclusters counter electrode for highly efficiency dye-sensitized solar cell: Durability test of PVP-Pt CE for DSSC</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_pip.1107&Exemplar=1&LAN=DE A1 Lan, Jo-Lin A1 Wan, Chi-Chao A1 Wei, Tzu-Chien A1 Hsu, Wen-Chi A1 Chang, Ya-Huei PB Wiley YR 2011 SN 1062-7995 JF Progress in Photovoltaics: Research and Applications VO 20 IS 1 SP 44 OP 50 LK http://dx.doi.org/https://doi.org/10.1002/pip.1107 DO https://doi.org/10.1002/pip.1107 SF ELIB - SuUB Bremen
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