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Interface analysis of ultrathin SiO2 layers between c‐Si su..:

Choi, Sungjin ; Baek, Jimin ; Kim, Taejun...
Progress in Photovoltaics: Research and Applications.  29 (2020)  1 - p. 32-46 , 2020
Link: https://doi.org/10.1002/pip.3338