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1 Ergebnisse
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Grazing incidence X-ray fluorescence analysis of buried int..:
Eisenhauer, David
;
Pollakowski, Beatrix
;
Baumann, Jonas
...
physica status solidi (a). 212 (2015) 3 - p. 529-534 , 2015
Link:
https://doi.org/10.1002/pssa.201400112
RT Journal T1
Grazing incidence X-ray fluorescence analysis of buried interfaces in periodically structured crystalline silicon thin-film solar cells: GIXRF analysis of buried interfaces in crystalline Si thin-film solar cells
UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_pssa.201400112&Exemplar=1&LAN=DE A1 Eisenhauer, David A1 Pollakowski, Beatrix A1 Baumann, Jonas A1 Preidel, Veit A1 Amkreutz, Daniel A1 Rech, Bernd A1 Back, Franziska A1 Rudigier-Voigt, Eveline A1 Beckhoff, Burkhard A1 Kanngieβer, Birgit A1 Becker, Christiane PB Wiley YR 2015 SN 1862-6300 JF physica status solidi (a) VO 212 IS 3 SP 529 OP 534 LK http://dx.doi.org/https://doi.org/10.1002/pssa.201400112 DO https://doi.org/10.1002/pssa.201400112 SF ELIB - SuUB Bremen
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