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1 Ergebnisse
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Electrical characterization of trapping phenomena at SiO2/S..:
Fiorenza, Patrick
;
Greco, Giuseppe
;
Vivona, Marilena
...
physica status solidi (a). 214 (2016) 4 - p. 1600366 , 2016
Link:
https://doi.org/10.1002/pssa.201600366
RT Journal T1
Electrical characterization of trapping phenomena at SiO2/SiC and SiO2/GaN in MOS-based devices
UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_pssa.201600366&Exemplar=1&LAN=DE A1 Fiorenza, Patrick A1 Greco, Giuseppe A1 Vivona, Marilena A1 Giannazzo, Filippo A1 Di Franco, Salvatore A1 Frazzetto, Alessia A1 Guarnera, Alfio A1 Saggio, Mario A1 Iucolano, Ferdinando A1 Patti, Alfonso A1 Roccaforte, Fabrizio PB Wiley YR 2016 SN 1862-6300 JF physica status solidi (a) VO 214 IS 4 SP 1600366 LK http://dx.doi.org/https://doi.org/10.1002/pssa.201600366 DO https://doi.org/10.1002/pssa.201600366 SF ELIB - SuUB Bremen
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