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1 Ergebnisse
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Raman scattering as a tool to characterize semiconductor cr..:
Szuszkiewicz, Wojciech
;
Jouanne, Michel
;
Morhange, Jean-François
...
physica status solidi (b). 251 (2013) 6 - p. 1133-1143 , 2013
Link:
https://doi.org/10.1002/pssb.201350142
RT Journal T1
Raman scattering as a tool to characterize semiconductor crystals, thin layers, and low-dimensional structures containing transition metals: Raman scattering for characterizing TM-containing semiconductors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_pssb.201350142&Exemplar=1&LAN=DE A1 Szuszkiewicz, Wojciech A1 Jouanne, Michel A1 Morhange, Jean-François A1 Kanehisa, Makoto A1 Dynowska, Elżbieta A1 Gas, Katarzyna A1 Janik, Elżbieta A1 Karczewski, Grzegorz A1 Kuna, Rafał A1 Wojtowicz, Tomasz PB Wiley YR 2013 SN 0370-1972 JF physica status solidi (b) VO 251 IS 6 SP 1133 OP 1143 LK http://dx.doi.org/https://doi.org/10.1002/pssb.201350142 DO https://doi.org/10.1002/pssb.201350142 SF ELIB - SuUB Bremen
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