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1 Ergebnisse
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X‐Ray Diffraction Microstrain Analysis for Extraction of Th..:
Yon, Victor
;
Rochat, Névine
;
Charles, Matthew
..
physica status solidi (b). 257 (2020) 4 - p. , 2020
Link:
https://doi.org/10.1002/pssb.201900579
RT Journal T1
X‐Ray Diffraction Microstrain Analysis for Extraction of Threading Dislocation Density of GaN Films Grown on Silicon, Sapphire, and SiC Substrates
UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_pssb.201900579&Exemplar=1&LAN=DE A1 Yon, Victor A1 Rochat, Névine A1 Charles, Matthew A1 Nolot, Emmanuel A1 Gergaud, Patrice PB Wiley YR 2020 SN 0370-1972 SN 1521-3951 JF physica status solidi (b) VO 257 IS 4 LK http://dx.doi.org/https://doi.org/10.1002/pssb.201900579 DO https://doi.org/10.1002/pssb.201900579 SF ELIB - SuUB Bremen
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