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1 Ergebnisse
1
Submicron resolution carrier lifetime analysis in silicon w..:
Gundel, Paul
;
Schubert, Martin C.
;
Heinz, Friedemann D.
...
physica status solidi (RRL) – Rapid Research Letters. 4 (2010) 7 - p. 160-162 , 2010
Link:
https://doi.org/10.1002/pssr.201004170
RT Journal T1 <Title>Submicron resolution carrier lifetime analysis in silicon with Fano resonances</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_pssr.201004170&Exemplar=1&LAN=DE A1 Gundel, Paul A1 Schubert, Martin C. A1 Heinz, Friedemann D. A1 Benick, Jan A1 Zizak, Ivo A1 Warta, Wilhelm PB Wiley YR 2010 SN 1862-6254 SN 1862-6270 JF physica status solidi (RRL) – Rapid Research Letters VO 4 IS 7 SP 160 OP 162 LK http://dx.doi.org/https://doi.org/10.1002/pssr.201004170 DO https://doi.org/10.1002/pssr.201004170 SF ELIB - SuUB Bremen
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