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Robust inference for one‐shot device testing data under exp..:
Balakrishnan, Narayanaswamy
;
Castilla, Elena
;
Martín, Nirian
.
Quality and Reliability Engineering International. 36 (2020) 6 - p. 1916-1930 , 2020
Link:
https://doi.org/10.1002/qre.2665
RT Journal T1 <Title>Robust inference for one‐shot device testing data under exponential lifetime model with multiple stresses</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_qre.2665&Exemplar=1&LAN=DE A1 Balakrishnan, Narayanaswamy A1 Castilla, Elena A1 Martín, Nirian A1 Pardo, Leandro PB Wiley YR 2020 SN 0748-8017 SN 1099-1638 JF Quality and Reliability Engineering International VO 36 IS 6 SP 1916 OP 1930 LK http://dx.doi.org/https://doi.org/10.1002/qre.2665 DO https://doi.org/10.1002/qre.2665 SF ELIB - SuUB Bremen
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