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Optimal designs of constant‐stress accelerated life‐tests f..:
Balakrishnan, Narayanaswamy
;
Castilla, Elena
;
Ling, Man Ho
Quality and Reliability Engineering International. 38 (2021) 2 - p. 989-1012 , 2021
Link:
https://doi.org/10.1002/qre.3031
RT Journal T1 <Title>Optimal designs of constant‐stress accelerated life‐tests for one‐shot devices with model misspecification analysis</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_qre.3031&Exemplar=1&LAN=DE A1 Balakrishnan, Narayanaswamy A1 Castilla, Elena A1 Ling, Man Ho PB Wiley YR 2021 SN 0748-8017 SN 1099-1638 JF Quality and Reliability Engineering International VO 38 IS 2 SP 989 OP 1012 LK http://dx.doi.org/https://doi.org/10.1002/qre.3031 DO https://doi.org/10.1002/qre.3031 SF ELIB - SuUB Bremen
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