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A Method for Correlating Field Life Degradation with Reliab..:
Coit, David W.
;
Evans, John L.
;
Vogt, Nathan T.
.
Quality and Reliability Engineering International. 21 (2005) 7 - p. 715-726 , 2005
Link:
https://doi.org/10.1002/qre.710
RT Journal T1 <Title>A Method for Correlating Field Life Degradation with Reliability Prediction for Electronic Modules</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_qre.710&Exemplar=1&LAN=DE A1 Coit, David W. A1 Evans, John L. A1 Vogt, Nathan T. A1 Thompson, James R. PB Wiley YR 2005 SN 0748-8017 SN 1099-1638 JF Quality and Reliability Engineering International VO 21 IS 7 SP 715 OP 726 LK http://dx.doi.org/https://doi.org/10.1002/qre.710 DO https://doi.org/10.1002/qre.710 SF ELIB - SuUB Bremen
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