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Method for improved secondary ion yields in cluster seconda..:
Brewer, Tim M.
;
Szakal, Christopher
;
Gillen, Greg
Rapid Communications in Mass Spectrometry. 24 (2010) 5 - p. 593-598 , 2010
Link:
https://doi.org/10.1002/rcm.4423
RT Journal T1 <Title>Method for improved secondary ion yields in cluster secondary ion mass spectrometry</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_rcm.4423&Exemplar=1&LAN=DE A1 Brewer, Tim M. A1 Szakal, Christopher A1 Gillen, Greg PB Wiley YR 2010 SN 0951-4198 SN 1097-0231 JF Rapid Communications in Mass Spectrometry VO 24 IS 5 SP 593 OP 598 LK http://dx.doi.org/https://doi.org/10.1002/rcm.4423 DO https://doi.org/10.1002/rcm.4423 SF ELIB - SuUB Bremen
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