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1 Ergebnisse
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P‐55: Process Development of Integrated Vcom and PAS using ..:
Kwack, Heeyoung
;
Kim, Eungyong
;
Park, Chulho
...
SID Symposium Digest of Technical Papers. 46 (2015) 1 - p. 1348-1351 , 2015
Link:
https://doi.org/10.1002/sdtp.10122
RT Journal T1 <Title>P‐55: Process Development of Integrated Vcom and PAS using Wet Etching Bias Control for High Resolution UHD AH‐IPS TFT‐LCD</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sdtp.10122&Exemplar=1&LAN=DE A1 Kwack, Heeyoung A1 Kim, Eungyong A1 Park, Chulho A1 Nam, Myungwoo A1 Yu, Sangjeon A1 Park, Jongwook A1 Shin, Sangmun PB Wiley YR 2015 SN 0097-966X SN 2168-0159 JF SID Symposium Digest of Technical Papers VO 46 IS 1 SP 1348 OP 1351 LK http://dx.doi.org/https://doi.org/10.1002/sdtp.10122 DO https://doi.org/10.1002/sdtp.10122 SF ELIB - SuUB Bremen
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