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10.4: Non‐Contact Current Measurements for AMOLED Backplane..:
Saleh, Ned
;
Sterling, Enrique
;
Toet, Daniel
SID Symposium Digest of Technical Papers. 46 (2015) 1 - p. 118-121 , 2015
Link:
https://doi.org/10.1002/sdtp.10306
RT Journal T1 <Title>10.4: Non‐Contact Current Measurements for AMOLED Backplanes Using Electron‐Beam‐Induced Plasma Probes</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sdtp.10306&Exemplar=1&LAN=DE A1 Saleh, Ned A1 Sterling, Enrique A1 Toet, Daniel PB Wiley YR 2015 SN 0097-966X SN 2168-0159 JF SID Symposium Digest of Technical Papers VO 46 IS 1 SP 118 OP 121 LK http://dx.doi.org/https://doi.org/10.1002/sdtp.10306 DO https://doi.org/10.1002/sdtp.10306 SF ELIB - SuUB Bremen
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