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1 Ergebnisse
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P-18: High Reliability Amorphous-Oxide Thin-Film Transistor..:
Yeh, Bo-Liang
;
Lin, Chun-Nan
;
Liu, Kuan-Hsien
.
SID Symposium Digest of Technical Papers. 47 (2016) 1 - p. 1183-1185 , 2016
Link:
https://doi.org/10.1002/sdtp.10877
RT Journal T1 <Title>P-18: High Reliability Amorphous-Oxide Thin-Film Transistors with an Expanded-Electrode Structure</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sdtp.10877&Exemplar=1&LAN=DE A1 Yeh, Bo-Liang A1 Lin, Chun-Nan A1 Liu, Kuan-Hsien A1 Chang, Ting-Chang PB Wiley YR 2016 SN 0097-966X JF SID Symposium Digest of Technical Papers VO 47 IS 1 SP 1183 OP 1185 LK http://dx.doi.org/https://doi.org/10.1002/sdtp.10877 DO https://doi.org/10.1002/sdtp.10877 SF ELIB - SuUB Bremen
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