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21‐4: Distinguished Paper: Experimental Decomposition of th..:
Kim, Dae Hwan
;
Choi, Sungju
;
Jang, Juntae
...
SID Symposium Digest of Technical Papers. 48 (2017) 1 - p. 298-301 , 2017
Link:
https://doi.org/10.1002/sdtp.11616
RT Journal T1 <Title>21‐4: Distinguished Paper: Experimental Decomposition of the Positive Bias Temperature Stress‐induced Instability in Self‐aligned Coplanar InGaZnO Thin‐film Transistors and its Modeling based on the Multiple Stretched‐exponential Functions</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sdtp.11616&Exemplar=1&LAN=DE A1 Kim, Dae Hwan A1 Choi, Sungju A1 Jang, Juntae A1 Kang, Hara A1 Kim, Dong Myong A1 Choi, Sung-Jin A1 Kim, Yong-Sung A1 Oh, Saeroonter A1 Baeck, Ju Heyuck A1 Bae, Jong Uk A1 Park, Kwon-Shik A1 Yoon, Soo Young A1 Kang, In Byeong PB Wiley YR 2017 SN 0097-966X SN 2168-0159 JF SID Symposium Digest of Technical Papers VO 48 IS 1 SP 298 OP 301 LK http://dx.doi.org/https://doi.org/10.1002/sdtp.11616 DO https://doi.org/10.1002/sdtp.11616 SF ELIB - SuUB Bremen
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