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48.3: Stress Model Simulation of TFT reliability for G8.6 l..:
Mo, Qiong-hua
;
Cho, An-Thung
;
Lin, Chun-Yan
...
SID Symposium Digest of Technical Papers. 50 (2019) S1 - p. 549-551 , 2019
Link:
https://doi.org/10.1002/sdtp.13557
RT Journal T1 <Title>48.3: Stress Model Simulation of TFT reliability for G8.6 large‐size TFT‐LCDs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sdtp.13557&Exemplar=1&LAN=DE A1 Mo, Qiong-hua A1 Cho, An-Thung A1 Lin, Chun-Yan A1 Hsu, James A1 Chen, Wade A1 Lu, York A1 Fan, Xiao-bin A1 Scott A1 Wu, Li-feng PB Wiley YR 2019 SN 0097-966X SN 2168-0159 JF SID Symposium Digest of Technical Papers VO 50 IS S1 SP 549 OP 551 LK http://dx.doi.org/https://doi.org/10.1002/sdtp.13557 DO https://doi.org/10.1002/sdtp.13557 SF ELIB - SuUB Bremen
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