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1 Ergebnisse
1
Excellent Uniformity and Reliability Top‐Gate Self‐Aligned ..:
Ma, Qian
;
Zhou, Xing-Yu
;
Hsu, Yuan-Jun
..
SID Symposium Digest of Technical Papers. 51 (2020) S1 - p. 184-186 , 2020
Link:
https://doi.org/10.1002/sdtp.13785
RT Journal T1 <Title>Excellent Uniformity and Reliability Top‐Gate Self‐Aligned IGZO TFTs with Cu Electrode</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sdtp.13785&Exemplar=1&LAN=DE A1 Ma, Qian A1 Zhou, Xing-Yu A1 Hsu, Yuan-Jun A1 Wu, Yuan-Chun A1 Zhang, Sheng-Dong PB Wiley YR 2020 SN 0097-966X SN 2168-0159 JF SID Symposium Digest of Technical Papers VO 51 IS S1 SP 184 OP 186 LK http://dx.doi.org/https://doi.org/10.1002/sdtp.13785 DO https://doi.org/10.1002/sdtp.13785 SF ELIB - SuUB Bremen
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